作者： 时间：2022-11-24
海纳光学所代理的美国Dataray生产厂商，为工业及科研用户提供优质的激光分析诊断方案，在2022年期间经常会收到用户有关于BeamScope-P8及其子型号的相关信息，对于以上产品于2022年初就已经与厂家确认该型号设备处于停产状态，且以上型号均已经无库存。本文介绍Dataray停产型号的替代产品。
BeamScope-P8具有较强的产品力，停产几年之后还是具有一定的市场影响力，而且有部分用户仍然在使用。如果您有关于BeamScope系列产品的维修和校准需求还是可以联系我们。
Dataray光斑分析仪替代型号：
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旧型号 |
新型号 |
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BeamScope-P8 |
Beam'R2 |
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光谱响应范围 |
Si：190-1150nm Ge：800-1800nm InAs：1500-3.5μm |
Si：190-1150nm InGaAs：650-1800nm Si+InGaAs：190-1800nm extended：190-2500nm |
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光束尺寸 |
100μm-45mm |
2μm-4mm（2mm for IGA-X.X） |
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分辨率 |
2μm或0.5%光束尺寸(哪个更好是哪个) |
0.1μm或0.05%光束尺寸 |
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精度 |
±2μm或±2%光束直径 |
±<2% ±0.5<μm |
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光束类型 |
连续或脉冲（5kHz刷新率以上@%5占空比，PRR越高越好） |
连续或脉冲（最小PRR=（500/微米级的光束直径）kHz） |
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M2测量范围 |
- |
1->20，±5% |
- |
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刷新率 |
1-2Hz,取决于PC处理器速度，扫描配置文件何选择的选项 |
5Hz |
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BeamScope-P8具有三种材质的基底，Si，Ge，InGaAs，分别对应190-1150nm，800-1800nm，1500-3.5μm的波段。为了替代BeamScope-P8，美国dataray推出了BeamMap2以及Beam'R2，能够满足190-2500nm波段。
作为替代停产产品设备，Dataray推出BeamMap2以及Beam'R2，这也是两款狭缝式光斑分析仪，具体的订购信息如下。
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型号 |
参数 |
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S-BMS2-4XY-DD-100 |
BeamMap2-4XY-DD-100 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -100, 0, +100, +400 µm). |
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S-BMS2-4XY-DD-2300-100 |
BeamMap2-4XY-DD-2300-100 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -100, 0, +100, +400 µm). |
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S-BMS2-4XY-DD-2300-250 |
BeamMap2-4XY-DD-2300-250 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -250, 0, +250, +1000 µm). |
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S-BMS2-4XY-DD-2300-50 |
BeamMap2-4XY-DD-2300-50 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -50, 0, +50, +200 µm). |
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S-BMS2-4XY-DD-2300-500 |
BeamMap2-4XY-DD-2300-500 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -500, 0, +500, +2000 µm). |
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S-BMS2-4XY-DD-2300-750 |
BeamMap2-4XY-DD-2300-750 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -750, 0, +750, +3000 µm). |
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S-BMS2-4XY-DD-250 |
BeamMap2-4XY-DD-250 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -250, 0, +250, +1000 µm). |
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S-BMS2-4XY-DD-2500-100 |
BeamMap2-4XY-DD-2500-100 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -100, 0, +100, +400 µm). |
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S-BMS2-4XY-DD-2500-250 |
BeamMap2-4XY-DD-2500-250 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -250, 0, +250, +1000 µm). |
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S-BMS2-4XY-DD-2500-50 |
BeamMap2-4XY-DD-50 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -50, 0, +50, +200 µm). |
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S-BMS2-4XY-DD-2500-500 |
BeamMap2-4XY-DD-2500-500 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -500, 0, +500, +2000 µm). |
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S-BMS2-4XY-DD-2500-750 |
BeamMap2-4XY-DD-2500-750 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -750, 0, +750, +3000 µm). |
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S-BMS2-4XY-DD-50 |
BeamMap2-4XY-DD-50 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -50, 0, +50, +200 µm). |
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S-BMS2-4XY-DD-500 |
BeamMap2-4XY-DD-500 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -500, 0, +500, +2000 µm). |
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S-BMS2-4XY-DD-750 |
BeamMap2-4XY-DD-750 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -750, 0, +750, +3000 µm). |
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S-BMS2-4XY-IGA-100 |
BeamMap2-4XY-IGA-100 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -100, 0, +100, +400 µm). |
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S-BMS2-4XY-IGA-250 |
BeamMap2-4XY-IGA-250 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -250, 0, +250, +1000 µm). |
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S-BMS2-4XY-IGA-50 |
BeamMap2-4XY-IGA-50 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -50, 0, +50, +200 µm). |
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S-BMS2-4XY-IGA-500 |
BeamMap2-4XY-IGA-500 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -500, 0, +500, +2000 µm). |
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S-BMS2-4XY-IGA-750 |
BeamMap2-4XY-IGA-750 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -750, 0, +750, +3000 µm). |
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S-BMS2-4XY-SI-100 |
BeamMap2-4XY-Si-100 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -100, 0, +100, +400 µm). |
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S-BMS2-4XY-SI-250 |
BeamMap2-4XY-Si-250 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -250, 0, +250, +1000 µm). |
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S-BMS2-4XY-SI-50 |
BeamMap2-4XY-Si-50 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -50, 0, +50, +200 µm). |
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S-BMS2-4XY-SI-500 |
BeamMap2-4XY-Si-500 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -500, 0, +500, +2000 µm). |
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S-BMS2-4XY-SI-750 |
BeamMap2-4XY-Si-750 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -750, 0, +750, +3000 µm). |
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S-BMS2-CM4-DD-2300-5 |
BeamMap2-CM4-DD-2300-5 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -5, 0, +5, +20 mm). |
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S-BMS2-CM4-DD-2500-5 |
BeamMap2-CM4-DD-2500-5 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -5, 0, +5, +20 mm). |
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S-BMS2-CM4-DD-5 |
BeamMap2-CM4-DD-5 scanning slit beam profiler (Si & InGaA, 190 to 1800 nm, slit planes at -5, 0, +5, +20 mm). |
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S-BMS2-CM4-IGA-5 |
BeamMap2-CM4-IGA-5 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -5, 0, +5, +20 mm). |
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S-BMS2-CM4-SI-5 |
BeamMap2-CM4-Si-5 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -5, 0, +5, +20 mm). |
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S-BR2-DD |
Beam'R2-DD scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm). |
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S-BR2-DD-2300 |
Beam'R2-DD-2300 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm). |
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S-BR2-DD-2500 |
Beam'R2-DD-2500 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm). |
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S-BR2-DD-IGA-2500 |
Beam'R2-DD-IGA-2500 scanning slit beam profiler (InGaAs & extended InGaAs, 650 to 2500 nm). |
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S-BR2-IGA |
Beam'R2-IGA scanning slit beam profiler (InGaAs, 650 to 1800 nm). |
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S-BR2-SI |
Beam'R2-Si scanning slit beam profiler (Si, 190 to 1150 nm). |
