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美国Dataray的BeamScope-P8的替代产品

作者: 时间:2022-11-24

海纳光学所代理的美国Dataray生产厂商,为工业及科研用户提供优质的激光分析诊断方案,在2022年期间经常会收到用户有关于BeamScope-P8及其子型号的相关信息,对于以上产品于2022年初就已经与厂家确认该型号设备处于停产状态,且以上型号均已经无库存。本文介绍Dataray停产型号的替代产品。

BeamScope-P8具有较强的产品力,停产几年之后还是具有一定的市场影响力,而且有部分用户仍然在使用。如果您有关于BeamScope系列产品的维修和校准需求还是可以联系我们。


Dataray光斑分析仪替代型号:

旧型号

新型号

BeamScope-P8

BeamMap2

Beam'R2

光谱响应范围

Si190-1150nm

Ge800-1800nm

InAs1500-3.5μm

Si190-1150nm

InGaAs650-1800nm

Si+InGaAs190-1800nm

extended190-2500nm

光束尺寸

100μm-45mm

2μm-4mm2mm for IGA-X.X

分辨率

2μm0.5%光束尺寸(哪个更好是哪个)

0.1μm0.05%光束尺寸

精度

±2μm或±2%光束直径

±<2% ±0.5<μm

光束类型

连续或脉冲(5kHz刷新率以上@%5占空比,PRR越高越好)

连续或脉冲(最小PRR=500/微米级的光束直径)kHz

M2测量范围

-

1->20,±5%

-

刷新率

1-2Hz,取决于PC处理器速度,扫描配置文件何选择的选项

5Hz

BeamScope-P8具有三种材质的基底,SiGeInGaAs,分别对应190-1150nm800-1800nm1500-3.5μm的波段。为了替代BeamScope-P8,美国dataray推出了BeamMap2以及Beam'R2,能够满足190-2500nm波段。

作为替代停产产品设备,Dataray推出BeamMap2以及Beam'R2,这也是两款狭缝式光斑分析仪,具体的订购信息如下。

型号

参数

S-BMS2-4XY-DD-100

BeamMap2-4XY-DD-100 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -100, 0, +100, +400 µm).

S-BMS2-4XY-DD-2300-100

BeamMap2-4XY-DD-2300-100 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -100, 0, +100, +400 µm).

S-BMS2-4XY-DD-2300-250

BeamMap2-4XY-DD-2300-250 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -250, 0, +250, +1000 µm).

S-BMS2-4XY-DD-2300-50

BeamMap2-4XY-DD-2300-50 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -50, 0, +50, +200 µm).

S-BMS2-4XY-DD-2300-500

BeamMap2-4XY-DD-2300-500 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -500, 0, +500, +2000 µm).

S-BMS2-4XY-DD-2300-750

BeamMap2-4XY-DD-2300-750 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -750, 0, +750, +3000 µm).

S-BMS2-4XY-DD-250

BeamMap2-4XY-DD-250 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -250, 0, +250, +1000 µm).

S-BMS2-4XY-DD-2500-100

BeamMap2-4XY-DD-2500-100 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -100, 0, +100, +400 µm).

S-BMS2-4XY-DD-2500-250

BeamMap2-4XY-DD-2500-250 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -250, 0, +250, +1000 µm).

S-BMS2-4XY-DD-2500-50

BeamMap2-4XY-DD-50 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -50, 0, +50, +200 µm).

S-BMS2-4XY-DD-2500-500

BeamMap2-4XY-DD-2500-500 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -500, 0, +500, +2000 µm).

S-BMS2-4XY-DD-2500-750

BeamMap2-4XY-DD-2500-750 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -750, 0, +750, +3000 µm).

S-BMS2-4XY-DD-50

BeamMap2-4XY-DD-50 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -50, 0, +50, +200 µm).

S-BMS2-4XY-DD-500

BeamMap2-4XY-DD-500 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -500, 0, +500, +2000 µm).

S-BMS2-4XY-DD-750

BeamMap2-4XY-DD-750 scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm, slit planes at -750, 0, +750, +3000 µm).

S-BMS2-4XY-IGA-100

BeamMap2-4XY-IGA-100 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -100, 0, +100, +400 µm).

S-BMS2-4XY-IGA-250

BeamMap2-4XY-IGA-250 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -250, 0, +250, +1000 µm).

S-BMS2-4XY-IGA-50

BeamMap2-4XY-IGA-50 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -50, 0, +50, +200 µm).

S-BMS2-4XY-IGA-500

BeamMap2-4XY-IGA-500 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -500, 0, +500, +2000 µm).

S-BMS2-4XY-IGA-750

BeamMap2-4XY-IGA-750 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -750, 0, +750, +3000 µm).

S-BMS2-4XY-SI-100

BeamMap2-4XY-Si-100 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -100, 0, +100, +400 µm).

S-BMS2-4XY-SI-250

BeamMap2-4XY-Si-250 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -250, 0, +250, +1000 µm).

S-BMS2-4XY-SI-50

BeamMap2-4XY-Si-50 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -50, 0, +50, +200 µm).

S-BMS2-4XY-SI-500

BeamMap2-4XY-Si-500 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -500, 0, +500, +2000 µm).

S-BMS2-4XY-SI-750

BeamMap2-4XY-Si-750 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -750, 0, +750, +3000 µm).

S-BMS2-CM4-DD-2300-5

BeamMap2-CM4-DD-2300-5 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm, slit planes at -5, 0, +5, +20 mm).

S-BMS2-CM4-DD-2500-5

BeamMap2-CM4-DD-2500-5 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm, slit planes at -5, 0, +5, +20 mm).

S-BMS2-CM4-DD-5

BeamMap2-CM4-DD-5 scanning slit beam profiler (Si & InGaA, 190 to 1800 nm, slit planes at -5, 0, +5, +20 mm).

S-BMS2-CM4-IGA-5

BeamMap2-CM4-IGA-5 scanning slit beam profiler (InGaAs, 650 to 1800 nm, slit planes at -5, 0, +5, +20 mm).

S-BMS2-CM4-SI-5

BeamMap2-CM4-Si-5 scanning slit beam profiler (Si, 190 to 1150 nm, slit planes at -5, 0, +5, +20 mm).

S-BR2-DD

Beam'R2-DD scanning slit beam profiler (Si & InGaAs, 190 to 1800 nm).

S-BR2-DD-2300

Beam'R2-DD-2300 scanning slit beam profiler (Si & InGaAs, 190 to 2300 nm).

S-BR2-DD-2500

Beam'R2-DD-2500 scanning slit beam profiler (Si & InGaAs, 190 to 2500 nm).

S-BR2-DD-IGA-2500

Beam'R2-DD-IGA-2500 scanning slit beam profiler (InGaAs & extended InGaAs, 650 to 2500 nm).

S-BR2-IGA

Beam'R2-IGA scanning slit beam profiler (InGaAs, 650 to 1800 nm).

S-BR2-SI

Beam'R2-Si scanning slit beam profiler (Si, 190 to 1150 nm).





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